Advancing Microscopy and Microanalysis

May 27, 2020 2:00 pm


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Ask the Expert In-situ Complementary XPS and Raman Analysis of Technologically Important Materials
X-ray Photoelectron Spectroscopy (XPS) and Raman spectroscopy have been used to analyse technologically relevant materials. An XPS spectrometer (Thermo Scientific Nexsa) was configured with a Raman spectrometer, enabling in-situ complementary analysis. XPS is a surface sensitive technique, with an information depth between 0-10nm. It is chemically selective allowing the user to investigate bonding states of the same element. Raman is a vibrational spectroscopy (typically more bulk sensitive) technique. It can give information about chemistry, but it also yields complementary structural or bonding information.

Presenter: James Lallo is a Surface Analysis expert who has been with Thermo Fisher Scientific for 5 years. His experience covers a wide range of Ultra High Vacuum techniques including surface probe, photon spectroscopy, and mass spectrometry. Prior to working with Thermo Scientific, James received his PhD from Rutgers University and did Post-Doctoral work at the University of South Florida.
When: Wednesday, May 27, 2020 2:00 pm, Eastern Daylight Time (New York, GMT-04:00)

Host: Thermo Fisher Scientific – MSD 


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